Properties of liquid silicon and carbon studied by ultrafast time-resolved x-ray absorption spectroscopy

Optics InfoBase Conference Papers

Volumn , Issue , 2002, Pages 21-22

  Johnson, S L ^a   Lindenberg, A M ^a   MacPhee, A G ^a   Falcone, R W ^a   Heimann, P A ^b   Jeschke, H O ^c   Garcia, M ^c   Rehr, J J ^d   Lee, R W ^e   Chang, Z ^f  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c FREIE UNIVERSITÄT BERLIN   (Germany)

^d UNIVERSITY OF WASHINGTON   (United States)

^e LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^f KANSAS STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; ELECTRONIC STRUCTURE; QUANTUM ELECTRONICS; X RAY ABSORPTION SPECTROSCOPY;

ELECTRONIC.STRUCTURE; LIQUID CARBON; LIQUID PHASE; LIQUID PHASIS; LIQUID SILICON; PROPERTY; TIME-RESOLVED X-RAY ABSORPTION SPECTROSCOPY; TIME-SCALES; ULTRA-FAST;

SILICON;

EID: 4644268257     PISSN: None     EISSN: 21622701     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (1)

1. J. N. Glosli and F. H. Lee, “Liquid-Liquid Phase Transformation in Carbon,” Phys. Rev. Lett. 82, 4659-4662 (1999).