Structure of crystalline and amorphous Ge probed by X-ray absorption and diffraction techniques

High Pressure Research

Volumn 24, Issue 1, 2004, Pages 93-99

  Di Cicco, A ^a   Principi, E ^a   Minicucci, M ^a   De Panfilis, S ^b   Filipponi, A ^c   Decremps, F ^d   Datchi, F ^d   Itie J P ^d   Munsch, P ^d   Polian, A ^d  

^a UNIVERSITY OF CAMERINO   (Italy)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c UNIVERSITY OF L'AQUILA   (Italy)

^d SORBONNE UNIVERSITÉ   (France)

Author keywords

Amorphous materials; EXAFS; Phase transitions; Structure; X ray absorption spectroscopy; X ray diffraction

Indexed keywords

ABSORPTION; ABSORPTION SPECTROSCOPY; AMORPHOUS MATERIALS; CRYSTAL STRUCTURE; CRYSTALLINE MATERIALS; CRYSTALLIZATION; DIFFRACTION; FLUORESCENCE; LATTICE CONSTANTS; OPTICAL COLLIMATORS; PHASE TRANSITIONS; PLASTIC FILMS; SOLID STATE DEVICES; X RAY DIFFRACTION ANALYSIS;

EXAFS; OSCILLATION FREQUENCY; SOLID STATE DETECTORS; X-RAY ABSORPTION SPECTROSCOPY;

GERMANIUM;

EID: 4644261166     PISSN: 08957959     EISSN: None     Source Type: Journal    
DOI: 10.1080/08957950410001661864     Document Type: Conference Paper

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