Morphological effect of epitaxial Ag films with thickness of the order of nanometres on the tribological properties of a single-crystal silicon surface in an ultra-high-vacuum environment

Proceedings of the Institution of Mechanical Engineers, Part J: Journal of Engineering Tribology

Volumn 218, Issue 4, 2004, Pages 279-291

  Goto, M ^a   Nakahara, T ^b   Honda, F ^c  

^a HINO MOTORS LTD   (Japan)

^b TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^c TOYOTA TECHNOLOGICAL INSTITUTE   (Japan)

Author keywords

Ag film; Atomic force microscopy (AFM); Morphology; Nanometre thickness; Reflection high energy electron diffraction (RHEED); Scanning tunnelling microscopy (STM); Single crystal; Solid lubricant; Tribology

Indexed keywords

ATOMIC FORCE MICROSCOPY; EPITAXIAL GROWTH; FRICTION; HIGH ENERGY ELECTRON DIFFRACTION; SCANNING TUNNELING MICROSCOPY; SILVER; SINGLE CRYSTALS; TRIBOLOGY; ULTRAHIGH VACUUM;

EPITAXIAL FILMS; FILM THICKNESS; NANOMETERS; NETWORK STRUCTURES;

THICK FILMS;

COATING; FILM; MORPHOLOGY; SCANNING ACOUSTIC MICROSCOPY; SILVER; TRIBOLOGY;

EID: 4644256350     PISSN: 13506501     EISSN: None     Source Type: Journal    
DOI: 10.1243/1350650041762613     Document Type: Article

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