End-to-end defect modeling

IEEE Software

Volumn 21, Issue 5, 2004, Pages 98-100

  Gras, Jean Jacques ^a  

^a MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; LIFE CYCLE; MATHEMATICAL MODELS; PROJECT MANAGEMENT; QUALITY ASSURANCE; SYSTEMS ENGINEERING;

CAUSAL MODELS; DEFECT MODELS; SOFTWARE QUALITY;

SOFTWARE ENGINEERING;

EID: 4644252483     PISSN: 07407459     EISSN: None     Source Type: Journal    
DOI: 10.1109/MS.2004.1331312     Document Type: Article

References (2)

1. N. Fenton and M. Neil, "A Critique of Software Defect Prediction Models," IEEE Trans. Software Eng., vol. 25, no. 5, 1999, pp. 675-689.
2. N.E. Fenton, P. Krause, and M. Neil, "Software Measurement: Uncertainty and Causal Modeling," IEEE Software, vol. 19, no. 4, 2002, pp. 116-122.