A facility for the analysis of reflection properties of surfaces

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 1, Issue , 2004, Pages 569-574

  Fiorentin, P ^a   Iacomussi, P ^b   Rossi, G ^b  

^a UNIVERSITY OF PADOVA   (Italy)

^b ISTITUTO ELETTROTECNICO NAZIONALE GALILEO FERRARIS   (Italy)

Author keywords

Photometry; Reflectometry; Surface

Indexed keywords

CCD CAMERAS; ISOTROPIC DIFFUSERS; REFLECTION FACTOR; SURFACE REFLECTION;

CAMERAS; CHARGE COUPLED DEVICES; GEOMETRICAL OPTICS; LIGHT REFLECTION; OPTICAL SYSTEMS; REFLECTOMETERS; SENSITIVITY ANALYSIS;

PHOTOMETRY;

EID: 4644249410     PISSN: 10915281     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IMTC.2004.1351113     Document Type: Conference Paper

References (9)

1. Paola Iacomussi, G. Rossi, P. Soardo, "The metrological characterisation of retroreflectors", Proceedings of VIII International Metrology Congress, Saint-Louis, France, October 2001.
2. G. Rossi, P. Soardo, "A new Gonioreflectometer", Proceedings of the 22nd Session of International Commission on Illumination, Vol. 1, Part 1, July 3-5, Melbourne, Australia, 1991
3. CIE Publication 17.4 "International Lighting Vocabulary", "International Electrotechnical Vocabulary Chapter 845: Lighting" CEI Publication 50(845) Section 845-04
4. CIE Publication 54 "Retroreflection: definition and measurement", 1982
5. UNI Publication 10828 "Retroreflectors - Terminology and photometric measurements", 1999.
6. G. Rossi, Paola Iacomussi, M. Sarotto, P. Soardo, "CCD matrix detector for photometry", Proceedings of VIII International Metrology Congress, Besançon France, 1997
7. I. Lewin, K. F. Lin, H. Zaleski, "High accuracy photometry using CCD technology", Proc. of the International Society for Optical Engineering. 1995: Vol. 2550, pp.28-35
8. Metrology in Photomery, A.Decusakis, John Weily & Son, 1999
9. P. Florentin, P. Iacomussi, G. Rossi, "Characterization and calibration of a CCD Detector for Light Engineering Measurements", IEEE Trans. on Instrum. Meas, to be published