Structural and morphological changes on surfaces with multiple phases studied by low-energy electron microscopy

Applied Surface Science

Volumn 237, Issue 1-4, 2004, Pages 51-57

  Hibino, H ^a   Homma, Y ^a   Hu, C W ^b   Uwaha, M ^c   Ogino, T ^d   Tsong, I S T ^b  

^a Kashino Diverse Brain Research Laboratory of NTT Communication Science Laboratories   (Japan)

^b ARIZONA STATE UNIVERSITY   (United States)

^c NAGOYA UNIVERSITY   (Japan)

^d YOKOHAMA NATIONAL UNIVERSITY   (Japan)

Author keywords

Low energy electron microscopy; Silicon; Surface structure

Indexed keywords

DIFFUSION; ELECTRON MICROSCOPES; EPITAXIAL GROWTH; MORPHOLOGY; NUCLEATION; SEMICONDUCTING SILICON;

DIFFUSION BARRIERS; DIFFUSION CONSTANT; LOW ENERGY ELECTRON MICROSCOPY;

SURFACE STRUCTURE;

EID: 4644241124     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(04)00992-4     Document Type: Conference Paper

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