Random target method for fast MTF inspection

Optics Express

Volumn 12, Issue 12, 2004, Pages 2610-2615

  Backman, Sampo M ^a   Makynen, Anssi J ^a   Kolehmainen, Timo T ^b   Ojala, Kai M ^b  

^a UNIVERSITY OF OULU   (Finland)

^b NOKIA RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; CHARGE COUPLED DEVICES; IMAGING SYSTEMS; INSPECTION; LENSES; OPTICAL VARIABLES MEASUREMENT; RANDOM PROCESSES; TRANSFER FUNCTIONS;

CCD DETECTORS; INSTRUMENTATION, MEASUREMENT AND METROLOGY; LENS UNDER TEST (LUT); MODULATION TRANSFER FUNCTIONS (MTF);

LIGHT MODULATION;

EID: 4644240434     PISSN: 10944087     EISSN: None     Source Type: Journal    
DOI: 10.1364/OPEX.12.002610     Document Type: Article

References (5)

1. H. Kubota and H. Ohzu, "Method of Response Function by Means of Random Chart," J Opt. Soc. Am. 47, 666-667 (1957).
2. A. Daniels, G. Boreman, A. Ducharme and E. Sair, "Random transparency targets for modulation transfer measurement in the visible and infrared regions," Opt Eng. 34, 860-868 (1995).
3. E. Levy, D. Peles, M. Opher-Lipson and S.G. Lipson, "Modulation transfer function of a lens with a random target method," Appl. Opt. 38, 679-683 (1999).
4. E.C. Ifeachor and B.W. Jervis, Digital signal processing (Prentice Hall, 2002), Ch. 3.
5. Sine Patterns LLC, 3800 Monroe Avenue, Pittsford, NY 14534, USA.