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Volumn 1, Issue , 2004, Pages 97-101
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A CN-FDTD scheme and its application to VLSI interconnects/substrate modeling
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Author keywords
[No Author keywords available]
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Indexed keywords
DISPERSION ERRORS;
TIME STEPPING;
TRI-DIAGONAL MATRICES;
TRUNCATION ERRORS;
ALGORITHMS;
ERROR ANALYSIS;
FINITE DIFFERENCE METHOD;
ITERATIVE METHODS;
MATHEMATICAL MODELS;
OPTICAL INTERCONNECTS;
SUBSTRATES;
TIME DOMAIN ANALYSIS;
VLSI CIRCUITS;
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EID: 4644237519
PISSN: 10774076
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (3)
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References (8)
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