Scanning tunneling microscopy and spectroscopy studies on structural and electronic properties of thin films of Co oxides and oxide precursor states on Ag(001)

Thin Solid Films

Volumn 464-465, Issue , 2004, Pages 65-75

  Shantyr, R ^a   Hagendorf, Ch ^a   Neddermeyer, H ^a  

^a MARTIN LUTHER UNIVERSITY HALLE WITTENBERG   (Germany)

Author keywords

Cobalt oxides; Scanning tunneling microscopy; Scanning tunneling spectroscopy; Silver; Thin film growth

Indexed keywords

DEPOSITION; ELECTRIC CONDUCTIVITY; ELECTRONIC PROPERTIES; EPITAXIAL GROWTH; EVAPORATION; FILM GROWTH; LOW ENERGY ELECTRON DIFFRACTION; SCANNING TUNNELING MICROSCOPY; SILVER; THERMAL EFFECTS; THIN FILMS;

COBALT OXIDES; CURRENT IMAGES (CI); ROOM TEMPERATURE (RT); SCANNING TUNNELING SPECTROSCOPY; THIN FILM GROWTH;

COBALT COMPOUNDS;

EID: 4644234049     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2004.06.043     Document Type: Article

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