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Volumn 59, Issue 8, 2004, Pages 1159-1164

A laser plasma X-ray source for the analysis of wafer surfaces by grazing emission X-ray fluorescence spectrometry

Author keywords

Grazing emission X ray fluorescence spectrometry; Laser plasma X ray source

Indexed keywords

CHARGE COUPLED DEVICES; DETECTORS; FLUORESCENCE; LASER PRODUCED PLASMAS; LASER PULSES; SILICON WAFERS; SPECTROMETERS; X RAY ANALYSIS;

EID: 4644233754     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sab.2003.11.011     Document Type: Conference Paper
Times cited : (9)

References (9)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.