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Volumn 59, Issue 8, 2004, Pages 1159-1164
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A laser plasma X-ray source for the analysis of wafer surfaces by grazing emission X-ray fluorescence spectrometry
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Author keywords
Grazing emission X ray fluorescence spectrometry; Laser plasma X ray source
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Indexed keywords
CHARGE COUPLED DEVICES;
DETECTORS;
FLUORESCENCE;
LASER PRODUCED PLASMAS;
LASER PULSES;
SILICON WAFERS;
SPECTROMETERS;
X RAY ANALYSIS;
GRAZING EMISSION X-RAY FLUORESCENCE SPECTROMETRY;
LASER PLASMA X-RAY SOURCES;
SPECTROMETRY;
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EID: 4644233754
PISSN: 05848547
EISSN: None
Source Type: Journal
DOI: 10.1016/j.sab.2003.11.011 Document Type: Conference Paper |
Times cited : (9)
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References (9)
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