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Volumn , Issue , 2000, Pages 136-140

Performance of the stud bump bonding (SBB) process in comparison to solder flip chip technology

Author keywords

Assembly; Bonding processes; Conductive adhesives; Flip chip; Gold; Independent component analysis; Metallization; Packaging; Production; Wafer bonding

Indexed keywords

ADHESIVES; ASSEMBLY; BONDING; CHIP SCALE PACKAGES; COATINGS; ELECTRONICS PACKAGING; FLIP CHIP DEVICES; GOLD; INDEPENDENT COMPONENT ANALYSIS; JOINING; MANUFACTURE; METALLIZING; PACKAGING; PRODUCTION; STUDS (FASTENERS); STUDS (STRUCTURAL MEMBERS);

EID: 4644231849     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ADHES.2000.860587     Document Type: Conference Paper
Times cited : (10)

References (3)
  • 2
    • 84952322214 scopus 로고    scopus 로고
    • Development of Conductive Stud Bump Technology for the Best Shape Design and Control
    • Hawaii
    • K. Higashi et al. 'Development of Conductive Stud Bump Technology for the Best Shape Design and Control' Pan Pacific Microelectronic Symposium 1998, Hawaii, p. 449
    • Pan Pacific Microelectronic Symposium 1998 , pp. 449
    • Higashi, K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.