Electrodeposited tungsten oxide films: Annealing effects on structure and electrochromic performance

Thin Solid Films

Volumn 468, Issue 1-2, 2004, Pages 32-42

  Deepa, M ^a   Kar, M ^a   Agnihotry, S A ^a  

^a NATIONAL PHYSICAL LABORATORY   (India)

Author keywords

Electrochromic; Structural property; Tungsten oxide; X ray diffraction

Indexed keywords

ABSORPTION; ANNEALING; CRYSTALLINE MATERIALS; DECOMPOSITION; ELECTROCHROMISM; ELECTRODEPOSITION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; OXIDES; SCANNING ELECTRON MICROSCOPY; TUNGSTEN COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

ANNEALING TEMPERATURE; NANOGRAINS; STRUCTURAL PROPERTY; TUNGESTEN OXIDE;

THIN FILMS;

EID: 4644231680     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2004.04.056     Document Type: Article

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