Inducing dendrite formation using an atomic force microscope tip

Scanning

Volumn 30, Issue 3, 2008, Pages 228-231

  Zhang, Gengxin ^a   Weeks, Brandon L ^a  

^a Texas Tech University   (United States)

Author keywords

AFM other scanned probe microscopes; Explosives

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; ATOMS; DENDRITES (METALLOGRAPHY); EPITAXIAL GROWTH; LANDFORMS; NUCLEATION;

ATOMIC FORCE MICROSCOPE (AFM); DENDRITE FORMATION; DENDRITE GROWTH; NUCLEATION BARRIERS; ROOM-TEMPERATURE (RT); SI(1 0 0 ); TIP CONTACT; TIP-INDUCED;

EXTREME ULTRAVIOLET LITHOGRAPHY;

PENTAERYTHRITYL TETRANITRATE; SILICON;

ARTICLE; ATOMIC FORCE MICROSCOPY; DENDRITE FORMATION; FILM; IMAGE ANALYSIS; MICROSCOPE; MORPHOLOGY; PHASE TRANSITION; PRIORITY JOURNAL; ROOM TEMPERATURE; STRUCTURE ANALYSIS; VAPOR; VAPOR DEPOSITION;

EID: 46349098381     PISSN: 01610457     EISSN: None     Source Type: Journal    
DOI: 10.1002/sca.20108     Document Type: Article

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