Growth by SR method and characterization of bis(thiourea)zinc(II) chloride single crystals

Materials Letters

Volumn 62, Issue 24, 2008, Pages 3931-3933

  Kushwaha, S K ^a   Vijayan, N ^a   Bhagavannarayana, G ^a  

^a NATIONAL PHYSICAL LABORATORY   (India)

Author keywords

Characterization methods; Crystal growth; Dielectrics; Optical materials; Properties

Indexed keywords

CRYSTALLOGRAPHY; CRYSTALS; DEPOSITS; DIFFRACTION; FOURIER TRANSFORMS; OPTICAL MATERIALS; POWDERS; SOLIDS; STRONTIUM; THERMOANALYSIS; THIOUREAS; UREA; X RAY ANALYSIS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; X RAY POWDER DIFFRACTION; X RAYS; ZINC; ZINC COMPOUNDS; ZINC SULFIDE;

CRYSTALLINE PERFECTION; DIELECTRIC MEASUREMENTS; ELSEVIER (CO); FOURIER TRANSFORM INFRARED (FT-IR); HIGH RESOLUTION X RAY DIFFRACTION (HR XRD); LARGE SIZES; LOW DENSITY; NON LINEAR OPTICAL (NLO) MATERIALS; POWDER X RAY DIFFRACTION (PXRD); SR METHOD; THERMAL STABILITY; ZINC (II);

SINGLE CRYSTALS;

EID: 46249125325     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2008.05.027     Document Type: Article

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