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Volumn , Issue , 2006, Pages 123-126

Bandgap voltage reference: Errors and techniques for their minimization

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ERROR ANALYSIS; VOLTAGE MEASUREMENT;

EID: 46249116175     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/BEC.2006.311076     Document Type: Conference Paper
Times cited : (6)

References (3)
  • 1
    • 0019291553 scopus 로고
    • Accurate analysis of temperature effects in Ic-Vbe characteristics with application to bandgap reference sources
    • Dec
    • Y.P. Tsividis, "Accurate analysis of temperature effects in Ic-Vbe characteristics with application to bandgap reference sources". IEEE J. Solid-State Circuits, vol. SC-15, pp. 1076-1084, Dec. 1980.
    • (1980) IEEE J. Solid-State Circuits , vol.SC-15 , pp. 1076-1084
    • Tsividis, Y.P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.