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Volumn 491, Issue 1-2, 2008, Pages 425-433
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Direct experimental mapping of microscale deformation heterogeneity in duplex stainless steel
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Author keywords
Dual phases; Electron back scattering diffraction; Plastic deformation; Simulations; Stainless steel
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Indexed keywords
BACKSCATTERING;
DIFFRACTION;
GRAIN BOUNDARIES;
STAINLESS STEEL;
TENSILE TESTING;
DEFORMATION HETEROGENEITIES;
DUAL PHASE;
DUAL PHASIS;
ELECTRON BACK SCATTERING DIFFRACTION TECHNIQUES;
ELECTRON BACKSCATTERING DIFFRACTIONS (EBSD);
IN-SITU TENSILE TEST;
MICROSCALE DEFORMATION;
SELF CONSISTENT MODELING;
SIMULATION;
VISCO-PLASTIC SELF-CONSISTENT;
PLASTIC DEFORMATION;
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EID: 46249113771
PISSN: 09215093
EISSN: None
Source Type: Journal
DOI: 10.1016/j.msea.2008.02.021 Document Type: Article |
Times cited : (57)
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References (23)
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