Dual-band planar electric metamaterial in the terahertz regime

Optics Express

Volumn 16, Issue 13, 2008, Pages 9746-9752

  Yuan, Yu ^a   Bingham, Christopher ^b   Tyler, Talmage ^a   Palit, Sabarni ^a   Hand, Thomas H ^a   Padilla, Willie J ^b   Smith, David R ^a   Jokerst, Nan Marie ^a   Cummer, Steven A ^a  

^a Duke University   (United States)

^b BOSTON COLLEGE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION;

EFFECTIVE THICKNESS; ELECTRIC RESONANCE; FREQUENCY AGILE; MATERIAL DESIGNS; METAMATERIAL STRUCTURES; MULTI-LAYER SYSTEM; OPTICAL FREQUENCY; TERA HERTZ;

METAMATERIALS;

METAL;

ARTICLE; CHEMISTRY; COMPUTER SIMULATION; ELECTRONICS; EQUIPMENT; EQUIPMENT DESIGN; INFRARED RADIATION; INSTRUMENTATION; LIGHT; MATERIALS TESTING; MICROWAVE RADIATION; OPTICS; RADIATION SCATTERING; THEORETICAL MODEL;

COMPUTER SIMULATION; ELECTRONICS; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; INFRARED RAYS; LIGHT; MATERIALS TESTING; METALS; MICROWAVES; MODELS, THEORETICAL; OPTICS; SCATTERING, RADIATION;

EID: 46249112426     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.16.009746     Document Type: Article

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