Characteristics and applications of RELAX, an ultrasensitive resonance ionization mass spectrometer for xenon

Journal of Analytical Atomic Spectrometry

Volumn 23, Issue 7, 2008, Pages 938-947

  Crowther, S A ^a   Mohapatra, R K ^a,c   Turner, G ^a   Blagburn, D J ^a   Kehm, K ^b   Gilmour, J D ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b WASHINGTON COLLEGE   (United States)

^c UNIVERSITY OF OTTAWA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC PHYSICS; ATOMS; CONCENTRATION (PROCESS); IONIZATION; ISOTOPES; MASS SPECTROMETERS; MASS SPECTROMETRY; POSITION CONTROL; RESONANCE; SILICON CARBIDE; SPECTROMETERS; SPECTROMETRY;

(PL) PROPERTIES; CURRENT CONFIGURATION; DETECTION LIMIT (DL); INDIVIDUAL (PSS 544-7); ISOTOPE RATIOS; MURCHISON METEORITE; RESONANCE IONIZATION; SIC GRAINS; TIME-OF-FLIGHT (TOF); TIME-OF-FLIGHT MASS SPECTROMETER (TOFMS); XENON ATOMS; XENON ISOTOPES;

XENON;

EID: 46149125742     PISSN: 02679477     EISSN: 13645544     Source Type: Journal    
DOI: 10.1039/b802899k     Document Type: Article

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