Possibilities of monitoring the polymerization process of silicon-based water repellents and consolidants in stones through infrared and Raman spectroscopy

Progress in Organic Coatings

Volumn 63, Issue 1, 2008, Pages 5-12

  Domingo, Concepción ^a   Alvarez de Buergo, Monica ^b   Sánchez Cortés, Santiago ^a   Fort, Rafael ^b   García Ramos, Jose V ^a   Gomez Heras, Miguel ^c  

^a INSTITUTO DE ESTRUCTURA DE LA MATERIA   (Spain)

^b Facultad de Ciencias Geológicas   (Spain)

^c QUEEN'S UNIVERSITY BELFAST   (United Kingdom)

Author keywords

Building stones; Conservation; FTIR; Polymerization; Raman

Indexed keywords

ARCHITECTURAL ACOUSTICS; CALCITE; CARBONATE MINERALS; CHEMICAL REACTIONS; COMPUTER NETWORKS; FREE RADICAL POLYMERIZATION; IRIDIUM; MATHEMATICAL MODELS; MOLECULAR SPECTROSCOPY; MONITORING; MONOMERS; NETWORK PROTOCOLS; NONMETALS; PIGMENTS; POLYMERIZATION; POLYMERS; PROCESS ENGINEERING; PROCESS MONITORING; RAMAN SCATTERING; RAMAN SPECTROSCOPY; REUSABILITY; SILICON; SPECTROSCOPY; SPECTRUM ANALYSIS; SULFATE MINERALS; WATERPROOFING;

APPLIED (CO); ARCHITECTURAL HERITAGE; CONSERVATION TREATMENTS; CONSOLIDANT; ELSEVIER (CO); IN ORDER; IN-SITU; INERT SURFACES; INFRARED (IR); INFRARED (IR) AND RAMAN SPECTRA; INFRARED (IR) REFLECTANCE; INFRARED AND RAMAN SPECTROSCOPY; POLYMERIZATION PROCESSES; PORTABLE INSTRUMENTS; RAMAN DATA; RAMAN TECHNIQUES; REAL TIME; SILICON-BASED; SPANISH; SPECTRAL REGIONS; SPECTROSCOPIC MONITORING; WATER REPELLENT (WR);

INFRARED SPECTROSCOPY;

EID: 46149116313     PISSN: 03009440     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.porgcoat.2008.03.002     Document Type: Article

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