Application overview of the potential seebeck microscope

International Conference on Thermoelectrics, ICT, Proceedings

Volumn , Issue , 2006, Pages 684-688

  Ziolkowski, P ^a   Karpinski, G ^a   Platzek, D ^a,b   Stiewe, C ^a   Muller E ^a  

^a GERMAN AEROSPACE CENTER DLR   (Germany)

^b Physics Technology Development and Consulting (PANCO)   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

INTERNATIONAL CONFERENCES; INTERNATIONAL PARTNERING; MATE RIAL PROPERTIES; MEASUREMENT INSTRUMENTS; SCANNING POTENTIAL; SCIENTIFIC OUTPUT; WIDE SPECTRUM;

PULSE MODULATION;

EID: 46149105249     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICT.2006.331234     Document Type: Conference Paper

References (5)

1. D. Platzek et al., "Spatial Resolution of the Seebeck Coefficient and thew Electric Potential", Proc. 24nd Int. Conf. on Thermoelectrics (ICT2005), Clamson, USA.
2. D. Platzek et al. "Spatial Resolution of the Seebeck Coefficient Measured on Thermoelectric Thin Films", Proc. 3rd European Conf. on Thermoelectrics (ECT2005), Nancy, France.
3. N. Chen, F. Gascoin and E. Müller, "Inhomogeneities in (AgSbTe2)×(PbTe)1-x materials", Appl. Phys. (2005) Lett. 87, 171903
4. P. Ziolkowski et al., "Spatially resolved determination of thermal properties by means of a travelling micro-probe", Proc. 4rd European Conf. on Thermoelectrics (ECT2006), Cardiff, U.K.
5. D. Platzek et al. "An Automated Microprobe for Temperature Dependent Spatial Scanning of the Seebeck Coefficient", Proc. 22nd Int. Conf. on Thermoelectrics (ICT2003), La Grande Motte, France.