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Ultramicroscopy

Volumn 108, Issue 8, 2008, Pages 750-762

Quantification of small, convex particles by TEM

(3) Andersen, Sigmund J a Holme, Børge a Marioara, Calin D a

a SINTEF MATERIALS AND CHEMISTRY (Norway)

Author keywords

Particle quantification; Schwartz Saltykov method; Size distribution; TEM

Indexed keywords

ALUMINUM; COLLOIDS; COMPUTER NETWORKS; ELECTRON MICROSCOPES; ELECTRON MICROSCOPY; ELECTRON OPTICS; IMAGE SEGMENTATION; IMAGING TECHNIQUES; MATRIX ALGEBRA; MICROSCOPIC EXAMINATION; NORMAL DISTRIBUTION; PROGRAMMING THEORY; SILICON; SIZE DETERMINATION; THREE DIMENSIONAL; TRANSIENT ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

AL-MG-SI ALLOYS; COMPUTER CODING; CONVENTIONAL TRANSMISSION ELECTRON MICROSCOPY (CTEM); ELSEVIER (CO); LOG-NORMAL DISTRIBUTIONS; OVERLAPPING PARTICLES; PARTICLE SHAPES; REAL DISTRIBUTION;

SIZE DISTRIBUTION;

ALUMINUM; MAGNESIUM; SILICON;

ARTICLE; IMAGE ANALYSIS; IMAGE QUALITY; PARTICLE SIZE; QUANTITATIVE ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 46149104546 PISSN: 03043991 EISSN: None Source Type: Journal
DOI: 10.1016/j.ultramic.2007.12.001 Document Type: Article

Times cited : (15)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.