Spatial resolution limits for synchrotron-based spectromicroscopy in the mid- and near-infrared

Journal of Synchrotron Radiation

Volumn 15, Issue 4, 2008, Pages 323-328

  Levenson, Erika ^a   Lerch, Philippe ^b   Martin, Michael C ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

Beamline; Diffraction; Emittance; Fourier transform infrared; Imaging; Infrared; Microscopy; Microspectroscopy; Resolution; Spectromicroscopy

Indexed keywords

CRYSTALLOGRAPHY; DIFFRACTION; ELECTRON BEAMS; ELECTRONS; LIGHT SOURCES; LIGHTING; MICROSCOPES; MINERALOGY; PARTICLE ACCELERATORS; PARTICLE BEAMS; POWER GENERATION; SYNCHROTRON RADIATION; SYNCHROTRONS; TELEMETERING SYSTEMS; TESTING;

(E ,2E) THEORY; (MIN ,MAX ,+) FUNCTIONS; ADVANCED LIGHT SOURCE (ALS); BEAM LINES; BEAM-LINES; DEMAGNIFICATION; DIFFRACTION LIMITED; ELECTRON BEAM SIZES; ELECTRON-BEAM; EMITTANCES; ENERGY BEAMS; ENERGY SPREADS; EXPERIMENTAL RESULTS; EXTREME ULTRA-VIOLET (EUV); FREE ELECTRON LASER (FEL); GENERATION ACCELERATORS; HIGH-BRIGHTNESS (HB); INFRARED MICROSCOPES; INTERNATIONAL (CO); MICROSCOPE OPTICS; NEAR INFRA-RED (NIR); NEAR-IR; OPTICAL (PET) (OPET); RESOLUTION TESTS; SPATIAL RESOLUTION (SR); SPATIAL RESOLUTION.; SPECTROMICROSCOPY; SPOT SIZES; STORAGE-RING; SYNCHROTRON LIGHT SOURCES; SYNCHROTRON SOURCES; THIRD GENERATION (3G); TRANSITION (JEL CLASSIFICATIONS:E52 ,E41 ,E31); TWO TYPES;

LIGHT;

EID: 46149098487     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S0909049508004524     Document Type: Article

References (24)

1. Bertrand, L., Doucet, J., Dumas, P., Simionovici, A., Tsoucaris, G. & Walter, P. (2003). J. Synchrotron Rad.10, 387-392.
2. Born, M. & Wolf, E. (1999). Principles of Optics, p. 371. Cambridge University Press.
3. Carr, G. L. (2001). Rev. Sci. Instrum.72, 1613.
4. Carr, G. L., Reffner, J. A. & Williams, G. P. (1995). Rev. Sci. Instrum.66, 1490.
5. Dumas, P. & Tobin, M. J. (2003). Spectrosc. Eur.15, 17-23.
6. Hecht, E. (1998). Optics, p. 416. New York: Addison Wesley Longman.
7. Hirschmugl, C. J. (1994). PhD thesis, Yale University, USA.
8. Holman, H.-Y. N. & Martin, M. C. (2006). Adv. Agron.90, 79-127.
9. Holman, H.-Y. N., Martin, M. C., Blakely, E. A., Bjornstad, K. & McKinney, W. R. (2000). Biopolym. Biospectrosc.57, 329-335.
10. Holman, H.-Y. N., Martin, M. C. & McKinney, W. R. (2003). Spectroscopy,17, 139-159.
11. Keller, L. P. et al. (2006). Science,314, 1728-1731.
12. Kim, K.-J. (1989). AIP Conf. Proc.184, 565.
13. Levenson, E., Lerch, P. & Martin, M. C. (2006). Infrared Phys. Technol.49, 45-52.
14. Li, Z. Q., Wang, G. M., Sai, N., Moses, D., Martin, M. C., Di Ventra, M., Heeger, A. J. & Basov, D. N. (2006). Nano Lett.6, 224-228.
15. Martin, M. C. & McKinney, W. R. (1998). Proc. Mater. Res. Soc.524, 11.
16. Martin, M. C. & McKinney, W. R. (2001). Ferroelectrics, 249, 1-10.
17. Miller, L. M. & Dumas, P. (2006). Biochim. Biophys. Acta,1758, 846-857.
18. Miller, L. M., Smith, G. D. & Carr, G. L. (2003). J. Biol. Phys.29, 219-230.
19. Raab, T. K. & Martin, M. C. (2001). Planta,213, 881-887.
20. Rayleigh, Lord (1879). Philos. Mag.8, 261-274.
21. Reffner, J. A., Martoglio, P. A. & Williams, G. P. (1995). Rev. Sci. Instrum.66, 1298.
22. Russ, J. C. (1986). Practical Stereology, p. 9. New York: Plenum.
23. Russ, J. C. (2002). The Image Processing Handbook, p. 320. Boca Raton: CRC Press.
24. Veiseh, M., Veiseh, O., Martin, M. C., Bertozzi, C. & Zhang, M. (2007). Biosens. Bioelectron.23, 253-260.