A method for removing surface contamination on ultra-pure copper spectrometer components

Journal of Radioanalytical and Nuclear Chemistry

Volumn 276, Issue 3, 2008, Pages 645-650

  Hoppe, E W ^a   Seifert, A ^a   Aalseth, C E ^a   Day, A R ^a   Farmer, O T ^a   Hossbach, T W ^a   McIntyre, J I ^a   Miley, H S ^a   Smart, J E ^a   Warren, G A ^a  

^a PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; RADON;

ARTICLE; CHEMOMETRIC ANALYSIS; CLEANING; MATERIALS; RADIATION MEASUREMENT; RADIOMETRY; SCANNING ELECTRON MICROSCOPY; SPECTROMETER; SURFACE PROPERTY; TECHNIQUE;

EID: 45849138939     PISSN: 02365731     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10967-008-0612-z     Document Type: Article

References (3)

1. C. Brofferioa et al., Nucl. Phys., B (Proc. Suppl.) 145 (2005) 268.
2. R. Brodzinski et al., Nucl. Instr. Meth. Phys. Res., A292 (1990) 337.
3. B. Clark et al., presented at the Synergies in Low-Background, Ultra-Sensitive Radiation Techniques Workshop, University of Minnesota, July 25-26, 2005, http://www.hep.umn.edu/lbcf/workshop/