Influence of trapped flux on critical currents of Josephson junctions

IEICE Electronics Express

Volumn 5, Issue 11, 2008, Pages 431-436

  Ebert, Bjoern ^a   Reich, Torsten ^b   Ortlepp, Thomas ^a   Febvre, Pascal ^b   Uhlmann, F Hermann ^a  

^a ILMENAU UNIVERSITY OF TECHNOLOGY   (Germany)

^b UNIVERSITÉ DE SAVOIE   (France)

Author keywords

Josephson junction; Moats; RSFQ; Trapped flux

Indexed keywords

ELECTRIC CONDUCTIVITY; JOSEPHSON JUNCTION DEVICES; MAGNETIC FIELDS; SUPERCONDUCTING MATERIALS; SUPERCONDUCTIVITY;

EXPERIMENTAL RESULTS; EXTERNAL FIELDS; EXTERNAL MAGNETIC FIELDS; JOSEPHSON JUNCTION (JJ); PINNING POINTS; TRAPPED FLUX;

CRITICAL CURRENTS;

EID: 45849118654     PISSN: None     EISSN: 13492543     Source Type: Journal    
DOI: 10.1587/elex.5.431     Document Type: Article

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