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Volumn 92, Issue 24, 2008, Pages

Time dependent degradation of photovoltaic modules by ultraviolet light

Author keywords

[No Author keywords available]

Indexed keywords

CONCENTRATION (PROCESS); DEGRADATION; ELECTRIC CURRENTS; ELECTRIC FAULT LOCATION; MULTITASKING; PHOTODEGRADATION; SHORT CIRCUIT CURRENTS; SILICONES; SPACE APPLICATIONS; SULFATE MINERALS; ULTRAVIOLET RADIATION;

EID: 45749145136     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2947589     Document Type: Article
Times cited : (31)

References (13)
  • 7
    • 43049150125 scopus 로고    scopus 로고
    • JAPIAU 0021-8979 10.1063/1.2891243.
    • C. G. Zimmermann, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.2891243 103, 083547 (2008).
    • (2008) J. Appl. Phys. , vol.103 , pp. 083547
    • Zimmermann, C.G.1
  • 9
    • 45749142293 scopus 로고    scopus 로고
    • the tocell sensitivity was used
    • www.azurspace.com; the top cell sensitivity was used.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.