![]() |
Volumn 100, Issue 24, 2008, Pages
|
Valence surface electronic states on Ge(001)
|
Author keywords
[No Author keywords available]
|
Indexed keywords
CHEMICAL PROPERTIES;
ELECTRIC CURRENTS;
ELECTRONIC STATES;
ELECTRONIC STRUCTURE;
EMISSION SPECTROSCOPY;
EXCAVATION;
GERMANIUM;
IMAGING TECHNIQUES;
MICROSCOPIC EXAMINATION;
PROBABILITY DENSITY FUNCTION;
SCANNING;
SCANNING PROBE MICROSCOPY;
SCANNING TUNNELING MICROSCOPY;
SILICON;
SPECTROSCOPIC ANALYSIS;
SPECTRUM ANALYSIS;
SURFACE PROPERTIES;
SURFACES;
TUNNELING (EXCAVATION);
(1 1 0) SURFACE;
(PL) PROPERTIES;
AMERICAN PHYSICAL SOCIETY (APS);
DENSITY-FUNCTIONAL (DF);
OPTICAL (PET) (OPET);
SEMI CONDUCTOR SURFACES;
SI(0 0 1);
SURFACE ELECTRONIC STATES;
SURFACE STATES;
TUNNELING SPECTROSCOPY;
DENSITY FUNCTIONAL THEORY;
|
EID: 45749144768
PISSN: 00319007
EISSN: 10797114
Source Type: Journal
DOI: 10.1103/PhysRevLett.100.246807 Document Type: Article |
Times cited : (36)
|
References (14)
|