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Volumn 8, Issue 5, 2007, Pages

Toward direct, micron-scale XRF elemental maps and quantitative profiles of wet marine sediments

Author keywords

High resolution XRF analysis; Major and trace elements; Micro XRF scanner

Indexed keywords


EID: 45449109947     PISSN: 15252027     EISSN: 15252027     Source Type: Journal    
DOI: 10.1029/2006GC001480     Document Type: Article
Times cited : (43)

References (12)
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    • Rapid and quantitative major element analysis method for wet fine-grained sediments using an XRF microscanner
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.