High precision Lu and Hf isotope analyses of both spiked and unspiked samples: A new approach

Geochemistry, Geophysics, Geosystems

Volumn 5, Issue 1, 2004, Pages

  Lapen, Thomas J ^a   Mahlen, Nancy J ^a   Johnson, Clark M ^a   Beard, Brian L ^a  

^a UNIVERSITY OF WISCONSIN MADISON   (United States)

Author keywords

176Lu 177Hf; Instrumental mass bias; Lu Hf; MC ICP MS

Indexed keywords

EID: 4544388243     PISSN: 15252027     EISSN: 15252027     Source Type: Journal    
DOI: 10.1029/2003GC000582     Document Type: Article

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