Electron trap effect of the sulfur + gold sensitization center on the photoelectron behaviors

Wuli Xuebao/Acta Physica Sinica

Volumn 53, Issue 6, 2004, Pages 2019-2023

  Li, Xiao Wei ^a   Li, Xin Zheng ^a   Jiang, Xiao Li ^a   Yu, Wei ^a   Tian, Xiao Dong ^a   Yang, Shao Peng ^a   Fu, Guang Sheng ^a  

^a HEBEI UNIVERSITY   (China)

Author keywords

Electron trap; Microwave phase sensitive detection; Photoelectron; Sensitization

Indexed keywords

EID: 4544387888     PISSN: 10003290     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (17)