The impact of frequency selective surfaces applied to standard wall construction materials

IEEE Antennas and Propagation Society, AP-S International Symposium (Digest)

Volumn 2, Issue , 2004, Pages 2187-2190

  Sung, Grace H H ^a   Sowerby, Kevin W ^a   Williamson, Allan G ^a  

^a UNIVERSITY OF AUCKLAND   (New Zealand)

Author keywords

[No Author keywords available]

Indexed keywords

ATTENUATION; ELECTROMAGNETIC WAVE INTERFERENCE; ENGINEERING RESEARCH; FREQUENCIES; SIGNAL PROCESSING; SURFACES; WIRELESS TELECOMMUNICATION SYSTEMS;

EXTERNAL SIGNALS; FREQUENCY SELECTIVE SURFACES (FSS); PROPAGATION PREDICTION; SIGNAL TRANSMISSION;

ELECTROMAGNETISM;

EID: 4544382415     PISSN: 15223965     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/aps.2004.1330645     Document Type: Conference Paper

References (8)

1. I. Cuinas, et al., "Comparison of the electromagnetic properties building materials at 5.8GHz and 62.4 GHz," Vehicular Technology Conference 2000 IEEE-VTS Fall VTC2000,52nd, vol. 2, pp. 780-785, 2000
2. K. Sato, etal., "Measurements of reflection and transmission characteristics of interior structures of office building in the 60 GHz band," IEEE Transactions on Antennas and Propagation, vol. 45, pp. 1783-1792, Dec. 1997.
3. B.A.Munk, Frequency Selective Surfaces Theory and Design. NewYork JohnWiley & Sons, 2000.
4. C. Mias, C.Tsakonas, C.Oswald, "An investigation into the feasibility of designing Frequency Selective Windows employing periodic structures. Final report for The Radiocommunications Agency," The Nottingham Trent Uriversity, Nottingham, U.K. Ref. AY3922, 2001.
5. R. J. Langley, E.A. Parker, "Equivalent circuit model for arrays of square loops," Electron. Letters, vol. 18, pp. 294-296, Feb, 1982.
6. N.Marcuvitz, Waveguide Handbook, vol.21: Peter Peregrinus Ltd. on behalf of the IEE, 1986.
7. D. K. Ghodgaonkar, Varadan,V.V., and Varadan, V.K., "Free-space measurement of complex permittivity and complex permeability of magnetic materials at microwave frequencies," IEEE Transactions on Instrumentation and Measurement, vol. 39, April, 1990.
8. Hewlett Packard,(Aug. 1985).Measurement of dielectric constant with the HP 8510 network analyzer. U.S.A, Hewlett-Packard.