Micro-Raman spectroscopy and its applications to measure residual stress in micro-structure

Jixie Qiangdu/Journal of Mechanical Strength

Volumn 26, Issue 4, 2004, Pages 389-

  Qiu, Yu ^a   Lei, Zhenkun ^a   Kang, Yilan ^a   Hu, Ming ^a   Xu, Han ^a   Niu, Hongpan ^a  

^a NONE

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EID: 4544381798     PISSN: 10019669     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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