Structural comparative study by RBS and XPD of stoichiometric and Bi-deficient SrBi2Nb2O9 thin films epitaxially grown on (1 0 0)SrTiO3

Surface Science

Volumn 569, Issue 1-3, 2004, Pages 125-141

  Duclere J R ^a,d   Guilloux Viry, M ^a   Solal, F ^b   Clerc, C ^c   Lalu, F ^c   Perrin, A ^a   Jezequel G ^b  

^a Institut de Chimie   (France)

^b UMR 6627   (France)

^c 91405 Orsay Campus   (France)

^d DUBLIN CITY UNIVERSITY   (Ireland)

Author keywords

Epitaxy; Laser methods; X ray photoelectron spectroscopy; X ray scattering, diffraction, and reflection

Indexed keywords

CRYSTAL ORIENTATION; EPITAXIAL GROWTH; RUTHERFORD BACKSCATTERING SPECTROSCOPY; STOICHIOMETRY; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

CHANNELING MODES; LASER METHODS; PHOTOELECTRON DIFFRACTION; STRUCTURAL MODIFICATIONS;

STRONTIUM COMPOUNDS;

EID: 4544379964     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2004.07.034     Document Type: Article

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