Improved carbon analysis with evactron plasma cleaning

Microscopy and Microanalysis

Volumn 10, Issue SUPPL. 2, 2004, Pages 964-965

  Rolland, Pierre ^a   Carlino, Vince ^b   Vane, Ronald ^b  

^a Alprimage   (France)

^b XEI Scientific   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4544376187     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927604880504     Document Type: Conference Paper

References (2)

1. N. Sullivan et al, Microscopy and Microanalysis 8 (suppl. 2)(2002) 720CD
2. C. Roberts, Moxtek, Inc. Application report : Improvements to Light element X-ray Windows for Si(Li) Detectors, Moxtek, Inc. Orem, Utah 2002