Effects of anisotropy and annealing on microhardness of inxBi22-xTe3 (x = 0.1 to 0.5) single crystals

Bulletin of Materials Science

Volumn 22, Issue 1, 1999, Pages 15-16

  Pandya, G R ^a   Bhavsar, S R ^a   Soni, P H ^a  

^a M S UNIVERSITY OF BARODA   (India)

Author keywords

Anisotropy; Annealing; Hardness

Indexed keywords

EID: 4544373865     PISSN: 02504707     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02745669     Document Type: Article

References (5)

1. Arivuoli D, Gnanam F D and Ramasamy P 1988 J. Mater. Sci. Lett. 7 711
2. Bhatt V P, Patel R M and Desai C F 1983 Cryst. Res. & Technol. 18 1173
3. Braunovic M 1973 The science of hardness testing and its research applications (eds) J H Westbrook and H Conard (Ohio: ASM) p. 329
4. Buckle H 1951 Rev. Metall. 48 957
5. Drabble J R 1963 Progress in semiconductors (eds) A F Gibson and R E Burgess (New York: John Wiley & Sons Inc.) Vol. 7, p. 47