Valence of highly dispersed cerium oxide species on silica quantitatively estimated by Ce LIII-edge XANES

Materials Transactions

Volumn 45, Issue 7, 2004, Pages 2062-2067

  Yoshida, Hisao ^a   Yuliati, Leny ^a   Hamajima, Tomoyo ^a   Hattori, Tadashi ^a  

^a NAGOYA UNIVERSITY   (Japan)

Author keywords

Highly dispersed cerium oxide species on silica; Silica supported cerium oxide; Ultraviolet absorption; Valence

Indexed keywords

BAND STRUCTURE; CALCINATION; CHARGE TRANSFER; IMPREGNATION; POSITIVE IONS; SILICA; SPECTROSCOPIC ANALYSIS; X RAY DIFFRACTION ANALYSIS;

ABSORPTION BANDS; CHEMICAL REACTIVITY; RIGAKU DIFFRACTOMETERS; ULTRAVIOLET ABSORPTION;

CERIUM COMPOUNDS;

EID: 4544369797     PISSN: 13459678     EISSN: None     Source Type: Journal    
DOI: 10.2320/matertrans.45.2062     Document Type: Conference Paper

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