FCM-based model selection algorithms for determining the number of clusters

Pattern Recognition

Volumn 37, Issue 10, 2004, Pages 2027-2037

  Sun, Haojun ^a   Wang, Shengrui ^a   Jiang, Qingshan ^b  

^a UNIVERSITÉ DE SHERBROOKE   (Canada)

^b XIAMEN UNIVERSITY   (China)

Author keywords

Clustering; Fuzzy C means; Overlapping clusters; Validity index

Indexed keywords

ALGORITHMS; DATABASE SYSTEMS; FUZZY SETS; IMAGING TECHNIQUES; INDEXING (OF INFORMATION); PARAMETER ESTIMATION;

CLUSTERING; FUZZY-C-MEANS; OVERLAPPING CLUSTERS; VALIDITY INDEX;

PATTERN MATCHING;

EID: 4544367326     PISSN: 00313203     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.patcog.2004.03.012     Document Type: Article

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