Synchrotron radiation for the characterization of energy dispersive X-ray spectrometers

Microscopy and Microanalysis

Volumn 10, Issue SUPPL. 2, 2004, Pages 98-99

  Procop, Mathias ^a   Scholze, Frank ^b  

^a BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

^b PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4544367322     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927604880152     Document Type: Conference Paper

References (6)

1. J. Schwinger, Phys. Rev. 75 (1949) 1912
2. G. Ulm et al., SPIE 3444 (1998) 610
3. H. Rabus et al, Nucl. Instr. and Meth. A 377 (2000) 209
4. B. Beckhoff et al., Nucl. Instr. and Meth. A 444 (2000) 480
5. F. Scholze, M. Procop, X-Ray Spectrom. 30 (2001) 69
6. M. Procop, Microsc. Microanal. In press