SCOPUS 정보 검색 플랫폼

Volumn 10, Issue SUPPL. 2, 2004, Pages 1380-1381

A DigitalMicrograph™ script for crystal thickness measurements using convergent beam electron diffraction

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4544357314 PISSN: 14319276 EISSN: None Source Type: Journal
DOI: 10.1017/S1431927604881637 Document Type: Conference Paper

Times cited : (8)

References (7)

1
- 0016564169
- P.M. Kelly et al., Phys. Stat., A31 (1975) 771.
- (1975) Phys. Stat. , vol.A31 , pp. 771
- Kelly, P.M.¹

2
- 0019530392
- S.M. Allen, Phil. Mag. A, 43 (1981) 325.
- (1981) Phil. Mag. A , vol.43 , pp. 325
- Allen, S.M.¹

3
- 0020168393
- S.M. Allen and E.L. Hall, Phil. Mag. A, 46 (1982) 243
- (1982) Phil. Mag. A , vol.46 , pp. 243
- Allen, S.M.¹ Hall, E.L.²

4
- 4544338544
- FEI Company
- CM Remote Control Freeware, FEI Company, http://www.feic.com/news/notes/ thicknes.htm
- CM Remote Control Freeware

5
- 0035099399
- D. Delille et al., Ultramicroscopy, 87 (2001) 5
- (2001) Ultramicroscopy , vol.87 , pp. 5
- Delille, D.¹

6
- 4544387122
- P. Stadelmann, JEMS software, http://cimewww.epfl.ch/people/stadelmann/ jemsWebSite/iems.html
- JEMS Software
- Stadelmann, P.¹

7
- 85019819187
- DigitalMicrograph Script Database, http://www.cis.tugraz.at/felmi/ dm_scripts/
- DigitalMicrograph Script Database

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.