Cell attachment and spreading processes monitored by the thickness shear-mode quartz sensor

IEEE Sensors Journal

Volumn 4, Issue 5, 2004, Pages 535-542

  Haider, Leila ^a   Gindre, Marcel ^a   Le Guillou Buffelo, Delphine ^a   Laugier, Pascal ^a   Perrot, Hubert ^a   Carreiras, Franck ^b   Darbeida, Halima ^b  

^a CNRS   (France)

^b UNIVERSITÉ DE CERGY PONTOISE   (France)

Author keywords

Cell adhesion; Impedance analysis; Quartz crystal sensor; Thickness shear mode (TSM)

Indexed keywords

CORRELATION METHODS; CRYSTALS; ELECTRIC RESISTANCE; MATRIX ALGEBRA; OPTICAL MICROSCOPY; PROTEINS; REACTION KINETICS;

CELL ADHESION; IMPEDANCE ANALYSIS; QUARTZ-CRYSTAL SENSOR; THICKNESS SHEAR MODE (TSM);

SENSORS;

EID: 4544348522     PISSN: 1530437X     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSEN.2004.832856     Document Type: Article

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