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Volumn 27, Issue 1, 2004, Pages 86-93

FEM modeling of temperature distribution of a flip-chip no-flow underfill package during solder reflow process

Author keywords

[No Author keywords available]

Indexed keywords

CURING; FINITE ELEMENT METHOD; FLIP CHIP DEVICES; MATHEMATICAL MODELS; REACTION KINETICS; SOLDERING; TEMPERATURE DISTRIBUTION;

EID: 4544347760     PISSN: 1521334X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TEPM.2004.830505     Document Type: Article
Times cited : (15)

References (20)
  • 2
    • 4544235024 scopus 로고
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    • R. Pennisi and M. Papageorge, "Adhesive and encapsulant material with fluxing properties," U.S. Patent 5 128746, 1992.
    • (1992) U.S. Patent 5 128746
    • Pennisi, R.1    Papageorge, M.2
  • 3
    • 4544339901 scopus 로고    scopus 로고
    • No-flow underfill of epoxy resin, anhydride, fluxing agent and surfactant
    • C. P. Wong and S. H. Shi, "No-flow underfill of epoxy resin, anhydride, fluxing agent and surfactant," U.S. Patent 6 180696, 2001.
    • (2001) U.S. Patent 6 180696
    • Wong, C.P.1    Shi, S.H.2
  • 4
    • 0031175635 scopus 로고    scopus 로고
    • The development of reflowable materials systems to integrate the reflow and underfill dispensing processes for DCA/FCOB assembly
    • D. Gamota and C. M. Melton, "The development of reflowable materials systems to integrate the reflow and underfill dispensing processes for DCA/FCOB assembly," IEEE Trans. Comp., Packag., Manufact. Technol. C, vol. 20, pp. 183-183, 1997.
    • (1997) IEEE Trans. Comp., Packag., Manufact. Technol. C , vol.20 , pp. 183-183
    • Gamota, D.1    Melton, C.M.2
  • 5
    • 0032156984 scopus 로고    scopus 로고
    • High performance no-flow underfills for flip-chip applications: Material characterization
    • C. P. Wong, S. H. Shi, and G. Jefferson, "High performance no-flow underfills for flip-chip applications: Material characterization," IEEE Trans. Comp., Packag., Manufact. Technol. A, vol. 21, pp. 450-450, 1998.
    • (1998) IEEE Trans. Comp., Packag., Manufact. Technol. A , vol.21 , pp. 450-450
    • Wong, C.P.1    Shi, S.H.2    Jefferson, G.3
  • 9
    • 0036826278 scopus 로고    scopus 로고
    • An integrated process modeling methodology and module for sequential multilayered substrate fabrication using a coupled cure-thermal-stress analysis approach
    • R. C. Dunne and S. K. Sitaraman, "An integrated process modeling methodology and module for sequential multilayered substrate fabrication using a coupled cure-thermal-stress analysis approach," IEEE Trans. Electron. Packag. Manufact., vol. 25, pp. 326-334, 2002.
    • (2002) IEEE Trans. Electron. Packag. Manufact. , vol.25 , pp. 326-334
    • Dunne, R.C.1    Sitaraman, S.K.2
  • 16
    • 4544256698 scopus 로고    scopus 로고
    • [Online]. Available: http://www.efunda.com
  • 19
  • 20
    • 3242772916 scopus 로고    scopus 로고
    • Modeling of the curing kinetics of no-flow underfill in flip-chip applications
    • June
    • Z. Zhang and C. P. Wong, "Modeling of the curing kinetics of no-flow underfill in flip-chip applications," IEEE Trans. Comp. Packag. Technol., vol. 27, pp. 383-390, June 2004.
    • (2004) IEEE Trans. Comp. Packag. Technol. , vol.27 , pp. 383-390
    • Zhang, Z.1    Wong, C.P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.