TOF-SIMS investigation of interactions between water and nitrogen at 15 K

Surface Science

Volumn 566-568, Issue 1-3 PART 2, 2004, Pages 1087-1092

  Kawanowa, H ^a,b   Kondo, M ^a,b   Gotoh, Y ^b   Souda, R ^a,b  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b TOKYO UNIVERSITY OF SCIENCE   (Japan)

Author keywords

Amorphous surfaces; Nitrogen molecule; Secondary ion mass spectroscopy; Water; Wetting

Indexed keywords

ADSORPTION; HYDRATES; HYDROGEN BONDS; HYDROPHOBICITY; MATRIX ALGEBRA; SECONDARY ION MASS SPECTROMETRY; SOLUTIONS; WETTING;

ION SPUTTERING; NEUTRALIZATION; QUASIRESONANT; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY (TOF-SIMS);

NITROGEN;

EID: 4544339614     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2004.06.056     Document Type: Article

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