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Volumn 19, Issue 9, 2004, Pages

Stress-induced optical anisotropies measured by modulated reflectance

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; CRYSTALLIZATION; DIELECTRIC DEVICES; ELECTRIC FIELDS; ELECTRON DIFFRACTION; EPITAXIAL GROWTH; HETEROJUNCTIONS; LIGHT POLARIZATION; LIGHT REFLECTION; OPTICAL SYSTEMS; PHOTOELASTICITY; PIEZOELECTRICITY; SEMICONDUCTOR MATERIALS;

EID: 4544336372     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/19/9/R01     Document Type: Review
Times cited : (18)

References (64)
  • 51
    • 0010638612 scopus 로고
    • ed M Balkanski (Amsterdam: North-Holland)
    • Aspnes D E 1980 Handbook on Semiconductors 2 ed M Balkanski (Amsterdam: North-Holland) p 145
    • (1980) Handbook on Semiconductors , vol.2 , pp. 145
    • Aspnes, D.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.