Scanning confocal electron microscopy of thick biological materials

Microscopy and Microanalysis

Volumn 10, Issue SUPPL. 2, 2004, Pages 1290-1291

  Hallegot P ^a   Zaluzec, N J ^b  

^a L ORÉAL RECHERCHE   (France)

^b ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4544334834     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927604883260     Document Type: Conference Paper

References (7)

1. Porter, K. R., et al., J. Exp. Med. 81; 233-246. (1945)
2. Buckley, I. K. and Porter, K. R. J. Microsc. 104; 107-120. (1975)
3. Frank, J., Electron Tomography Plenum Press, New York (1992)
4. Zaluzec N.J. Microscopy-Today Vol 6 (2003). US. Patent #6,548,810 (2003)
5. th Eur. Reg. Conf. Electron Microscopy, The Hague 2, 270. (1980)
6. Bloom E.E. and G. K. Aghajanian Microsc. Microanal. 5 (Suppl. 2) (2002) 1012 (1968).
7. This work was supported in part by the U.S. DoE under BES-MS W-31-109-Eng-38 at ANL