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Volumn 43, Issue 22, 2004, Pages 2965-2967

A silicon analogue of vinyllithium: Structural characterization of a disilenide

Author keywords

Lithium; Low valent compounds; Silicon

Indexed keywords

LITHIUM; REDUCTION; STRUCTURE (COMPOSITION); X RAY CRYSTALLOGRAPHY;

EID: 4544313847     PISSN: 14337851     EISSN: None     Source Type: Journal    
DOI: 10.1002/anie.200353347     Document Type: Article
Times cited : (119)

References (35)
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    • (1997) Angew. Chem. Int. Ed. Engl. , vol.36 , pp. 2503
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    • b) H. Schäfer, W. Saak, M. Weidenbruch, Angew. Chem. 2000, 112, 3847; Angew. Chem. Int. Ed. 2000, 39, 3703.
    • (2000) Angew. Chem. Int. Ed. , vol.39 , pp. 3703
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    • a) M. Kira, T. Murayama, C. Kabuto, K. Ebata, H. Sakurai, Angew. Chem. 1994, 106, 1575; Angew. Chem. Int. Ed. Engl. 1994, 33, 1489;
    • (1994) Angew. Chem. Int. Ed. Engl. , vol.33 , pp. 1489
  • 27
    • 4544246884 scopus 로고    scopus 로고
    • -3. CCDC 223197 contains the supplementary crystallographic data for this paper. These data can be obtained free of charge via www.ccdc.cam.ac.uk/conts/ retrieving.html (or from the Cambridge Crystallographic Data Centre, 12 Union Road, Cambridge CB21EZ, UK; fax: (+ 44) 1223-336-033; or deposit@ccdc.cam.ac.uk) .
  • 33
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    • note
    • 2 (δ = 97.8, -10.6 ppm).[16a]


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.