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Volumn 49, Issue 4, 2004, Pages 579-584

Analysis of chemical bonding in Zn3P2 crystals from x-ray diffraction data

Author keywords

[No Author keywords available]

Indexed keywords

PHOSPHORUS; ZINC DERIVATIVE;

EID: 4544307717     PISSN: 10637745     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.1780620     Document Type: Article
Times cited : (9)

References (11)
  • 5
    • 0038243873 scopus 로고    scopus 로고
    • I. E. Zanin, K. B. Aleǐnikova, and M. Yu. Antipin, Kristallografiya 48 (2), 232 (2003) [Crystallogr. Rep. 48, 199 (2003)].
    • (2003) Crystallogr. Rep. , vol.48 , pp. 199
  • 7
    • 0003518063 scopus 로고
    • Dunod, Paris, Van Nostrand, New York, 1965; Metallurgiya, Moscow
    • J. P. Suchet, Chemical Physics of Semiconductors (Dunod, Paris, 1962; Van Nostrand, New York, 1965; Metallurgiya, Moscow, 1969).
    • (1962) Chemical Physics of Semiconductors
    • Suchet, J.P.1
  • 8
    • 0004150157 scopus 로고
    • Siemens Analytical Instruments, Madison, Wisconsin, USA
    • G. M. Sheldrick, SHELXTL PLUS. Release 4.2 (Siemens Analytical Instruments, Madison, Wisconsin, USA, 1991).
    • (1991) SHELXTL PLUS. Release 4.2
    • Sheldrick, G.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.