3-d X-ray microscopy using a laboratory source

Microscopy and Microanalysis

Volumn 10, Issue SUPPL. 2, 2004, Pages 1036-1037

  Feser, M ^a   Duewer, F ^a   Wang, S ^a   Scott, D ^a   Lyon, A ^a   Yun, W ^a  

^a XRADIA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4544306902     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927604880292     Document Type: Conference Paper

References (2)

1. X-ray Microscopy 2002 Conference Proceedings, J. Susini, D. Joyeux and F. Polack Editors, J. Phys. IV 104 (2003).
2. F. Zernike, Das Phasenkontrastverfahren bei der mikroskopischen Beobachtung, Z. tech. Phys. 36 (1935) 36.