An ultra-high-tilt two-contact electrical biasing specimen holder for electron holography and electron tomography of semiconductor devices

Microscopy and Microanalysis

Volumn 10, Issue SUPPL. 2, 2004, Pages 1012-1013

  Dunin Borkowski, R E ^a   Twitchett, A C ^a   Barnard, J S ^a   Broom, R F ^a   Midgley, P A ^a   Robins, A C ^b   Smith, D W ^b   Gronsky, J J ^b   Fischione, P E ^b  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b E A Fischione Instruments Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4544302065     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927604883156     Document Type: Conference Paper

References (2)

1. A.C. Twitchett et al., Phys. Rev. Lett. 88 (2002) 238302.
2. We thank the Royal Society, the EPSRC and Newnham College, Cambridge for financial support, and Stuart Holmes for help with the electrical connections to the SEM stub.