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Volumn , Issue , 2004, Pages 334-338
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A new X-factor contribution measure for identifying machine level capacity constraints and variability
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Author keywords
Arrival rate variability; Capacity constraints; Cycle time; Processing time variability; X factor contribution
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Indexed keywords
COMPUTER SIMULATION;
DATA PROCESSING;
DELAMINATION;
ELECTRIC BREAKDOWN;
FUNCTIONS;
PURCHASING;
QUEUEING THEORY;
THROUGHPUT;
ARRIVAL RATE VARIABILITY;
CAPACITY CONSTRAINTS;
CYCLE TIME;
PROCESSING TIME VARIABILITY;
PRODUCT MIX;
X-FACTOR CONTRIBUTION;
SEMICONDUCTOR DEVICE MANUFACTURE;
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EID: 4544296117
PISSN: 1523553X
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (4)
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References (11)
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