Simulation of signal generation processes in semiconductor sensor layers for Medipix1 and 2

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 531, Issue 1-2, 2004, Pages 62-67

  Mitschke, M ^a,b   Giersch, J ^a   Anton, G ^a  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

^b FRAUNHOFER INSTITUTE FOR NON DESTRUCTIVE TESTING   (Germany)

Author keywords

Photon counting; Semiconductor detectors; X ray imaging

Indexed keywords

CADMIUM COMPOUNDS; COMPUTER SIMULATION; IMAGING TECHNIQUES; SEMICONDUCTING GALLIUM ARSENIDE; SENSORS; SIGNAL PROCESSING; SIZE DETERMINATION; X RAY ANALYSIS;

PHOTON COUNTING; SEMICONDUCTOR DETECTORS; SPATIAL RESOLUTION; X-RAY IMAGING;

SEMICONDUCTOR MATERIALS;

EID: 4544294743     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2004.05.075     Document Type: Conference Paper

References (8)

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5. Y. Namito, H. Hirayama, Lscat: low-energy photon-scattering expansion for the egs4 code (inclusion of electron impact ionization), Technical Report, High Energy Accelerator Research Orginization, 1-1 Oho, Tsukuba-shi, Ibaraki-ken, 305-0801, Japan, May 2000.
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