A two-stage gas amplification secondary electron detector for ultra-high resolution imaging

Microscopy and Microanalysis

Volumn 10, Issue SUPPL. 2, 2004, Pages 1058-1059

  Thiel, B L ^a   Toth, M ^b   Schroemges, R P M ^b   Scholtz, J J ^b   Van Veen, G ^b   Knowles, W R ^b  

^a STATE UNIVERSITY OF NEW YORK   (United States)

^b Thermo Fisher Scientific   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4544293185     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927604884654     Document Type: Conference Paper

References (2)

1. B.L. Thiel and M. Toth, J. Appl. Phys. Rev, in press.
2. B.L. Thiel, et al., J. Microsc.-Oxf., 187 (1997) 143.